SNAP: Fabrication of long coupled microresonator chains with sub-angstrom precision
نویسندگان
چکیده
منابع مشابه
Precision Limits to STEM Imaging from Dynamical Scattering and Channeling of Sub-Angstrom Electron Probes
Precision smaller than the resolution is routinely achieved in electron microscopy, with 3-5 pm being the best reported for STEM [1], compared to 1-3 pm for TEM [2]. The signal to noise ratio (SNR) introduces the fundamental precision limit in STEM and TEM images. However, before the fundamental limit is reached, practical limits are usually encountered, such as image distortions caused by inst...
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At Lawrence Livermore National Laboratory (LLNL), we have the unique combination of precision turning and metrology capabilities critical to the fabrication of large optical elements. We have developed a self-referenced interferometer to measure errors in aspheric optics to subnanometer accuracy over 200-millimeter apertures, a dynamic range of 5x10. We have utilized diamond turning to figure o...
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FREDRIK K. FATEMI,* JONATHAN E. HOFFMAN, PABLO SOLANO, ELIOT F. FENTON, GUY BEADIE, STEVEN L. ROLSTON, AND LUIS A. OROZCO Army Research Laboratory, Adelphi, Maryland 20783, USA Joint Quantum Institute, Department of Physics, University of Maryland and National Institute of Standards and Technology, College Park, Maryland 20742, USA Naval Research Laboratory, Washington, DC 20375, USA *Correspon...
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It is reported that lattice imaging with a 300 kV field emission microscope in combination with numerical reconstruction procedures can be used to reach an interpretable resolution of about 80 pm for the first time. A retrieval of the electron exit wave from focal series allows for the resolution of single atomic columns of the light elements carbon, nitrogen, and oxygen at a projected nearest ...
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ژورنال
عنوان ژورنال: Optics Express
سال: 2012
ISSN: 1094-4087
DOI: 10.1364/oe.20.027896